Last edited by Vudom
Monday, November 2, 2020 | History

2 edition of International Test Conference (Itc 19th. 1988 : Proceedings) found in the catalog.

International Test Conference (Itc 19th. 1988 : Proceedings)

International Test Conference (Itc 19th. 1988 : Proceedings)

  • 29 Want to read
  • 26 Currently reading

Published by Ieee Computer Society .
Written in English

    Subjects:
  • Automatic test equipment,
  • Circuits,
  • Congresses,
  • Electronic digital computers,
  • Integrated circuits,
  • Testing,
  • Reference

  • The Physical Object
    FormatHardcover
    ID Numbers
    Open LibraryOL11390747M
    ISBN 10081868870X
    ISBN 109780818688706

    INTERNATIONAL TEST CONFERENCE ® Table of Contents SESSION 23 RAM TEST AND REPAIR: TODAY AND TOMORROW Session Chair; M. D'Abreu A Reusable BIST with Software-assisted Auto Repair Technology for Improved Memory and IO Debug, Validation and Test Time B. Querbach, R. Khanna, D. Blankenbeckler, Y. Zhang, R. Anderson. Exam Attempts: For National and UST/AST Certification Exams, you will have six exam attempts within a six-month period. You are responsible for paying the exam fee at every attempt. Once you have attempted an exam six times, you must wait six months from the first attempt to register again. Legal Name Only: You must enter your first and last.


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International Test Conference (Itc 19th. 1988 : Proceedings) Download PDF EPUB FB2

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